Spatial Identification of Dielectric Properties Using Synthetic Aperture Radar

Jan Barowski, Jochen Jebramcik, Jonas Wagner, Nils Pohl, Ilona Rolfes

IEEE MTT-S In­ter­na­tio­nal Micro­wa­ve Work­shop Se­ries on Ad­van­ced Ma­te­ri­als and Pro­ces­ses for RF and THz Ap­p­li­ca­ti­ons (IMWS-AMP 2019), pp. 139-141, DOI: 10.1109/IMWS-AMP.2019.8880121, Bo­chum, Ger­ma­ny, July 16-18, 2019


This contribution presents a methodology and a measurement setup for spatially resolved material characterization. For this purpose, calibrated millimeter-wave (mmWave) frequency modulated continuous wave (FMCW) radar systems, operating up to 250 GHz, are utilized. The calibration scheme allows for a systematic error correction comparable to a vector network analyzer (VNA). A synthetic aperture radar (SAR) measurement is used to generate a focused 3-dimensional image with very high resolution. A precise spatial distribution of the material parameters is obtained by a novel combination of the imaging and material parameter extraction algorithms.

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